Applied Scanning Probe Methods III: Characterization (NanoScience and Technology) Book Information:

ze of 1986 on Sc- ning Tunneling Microscopy sig- led a new era in imaging. The sc- ning probes emerged as a new i- trument for imaging with a pre- sion suf?cient to delineate single atoms. At ?rst there were two the Scanning Tunneling Microscope, or STM, and the Atomic Force Mic- scope, or AFM. The STM relies on electrons tunneling between tip and sample whereas the AFM depends on the force acting on the tip when it was placed near the sample. These were quickly followed by the - gneticForceMicroscope,MFM,and the Electrostatic Force Microscope, EFM. The MFM will image a single magnetic bit with features as small as 10nm. With the EFM one can monitor the charge of a single electron. Prof. Paul Hansma at Santa Barbara opened the door even wider when he was able to image biological objects in aqueous environments. At this point the sluice gates were opened and a multitude of different instruments appeared. There are signi?cant differences between the Scanning Probe Microscopes or SPM, and others such as the Scanning Electron Microscope or SEM. The probe microscopes do not require preparation of the sample and they operate in ambient atmosphere, whereas, the SEM must operate in a vacuum environment and the sample must be cross-sectioned to expose the proper surface. However, the SEM can record 3D image and movies, features that are not available with the scanning probes.

• Book Type/Genre :

Higher Education Textbooks

• Book Binding :

Hardcover

• Language :

English

• Number of Pages :

Page count varies on each edition/reprint

• ISBN - 10 :

• Applied Scanning Probe Methods III: Characterization (NanoScience and Technology) Published On :

2006

• Resource:

Textbooks & Study Guides, Higher Education Textbooks Book is recommended for Students, Teachers, Graduates, Professionals, and all bibliophiles

Disclaimer:

• Applied Scanning Probe Methods III: Characterization (NanoScience and Technology) Book is not for reading online or for free download in PDF or eBook format.
• Table of Contents, Index, Syllabus, summary and image of Applied Scanning Probe Methods III: Characterization (NanoScience and Technology) book may be of a different edition or of the same title.
• The Price of this product may change due to the reprinting of the book or by the publisher. For imported books, the price may change frequently due to exchange rates.
• Applied Scanning Probe Methods III: Characterization (NanoScience and Technology) by Bharat Bhushan; Harald Fuchs Book reviews and ratings are trustworthy and the product description given above is true to the best. The product description posted here by sellers would be updated based on the Customer's feedback, if the details are not accurate.
• The customers who have bought this product can write your best reviews and suggest the product if the item's price is low which would be helpful for the buyers interested to purchase. Read Best & Top Books related to this item
• The above Bibliographic information is specific to this book which is being listed for sale. Any Colophons printed at the end of the book is owned by book author and publisher
• Special offers, deals & discounts on this product are subject to the terms and conditions owned by the website